Digital Instruments Dimension 3000
The Digital Instrument Dimension 3000 is a Scanning Probe Microscope (SPM) that is used primarily in Tapping and Contact modes to quantitatively measure the surface morphology of samples. The surface is imaged using a very sharp (tip radius ~ 5 nm) probe that is scanned over the sample surface. The system is also capable of Scanning Tunneling Microscopy (STM) in air. A variety of other techniques can be used in principle, but might require investments in specialized tips, and will depend on the researcher to develop the expertise to use the mode.
Instrument Status
- Last updated at 15:30 on 02/05/2008.
- The AFM is currently UP.
- A tip holder for Force Modulation Microscopy has been acquired on February 5th, 2008
Instrument Capabilities
Imaging Modes
- Tapping Mode (Common)
- Contact Mode (Common)
- Force Modulation Microscopy (New)
- STM Mode (Rare)
- Scanning Tunneling Spectroscopy (Rare)
- Magnetic Force Microscopy (Rare)
- Lateral Force Microscopy (Rare)
Data Acquired
- Quantitative surface topography
- RMS surface roughness
- Nano-scale surface imaging
Imaging Resolution
- Lateral resolution < 2 nm
- Vertical resolution < 1 Å
- Maximum scan area 100 x 100 µm2
- Maximum vertical range 5 µm
- Vertical topography > 1 µm is challenging
- Sample size: up to a 6" wafer
- Sample height: < 1 cm
