3-D Nanotomography in TEM

3-D Nanotomography in TEM (image is a XMT digital image of Ni gear 2-mm diameter, 0.2 mm thick, obtained using a micro-scale analog of the same operating principle)

We are carrying out these studies using facilities outside of the state and the acquisition of a new TEM with more advanced capabilities than the current TEM is needed. This work is based on existing capabilities in obtaining 3-D characterization of microscale systems using X-ray microtomography (XMT) for a wide range of applications.

Implications
Structural characterization of nano particles and structure at 1-100 nm level is key in many medical and chemical applications for example in nanotoxicology.

Research Group Contacts
Professor Jan D. Miller, Dr. C.L. Lin and Prof. Siva Guruswamy, all of the Department of Metallurgy

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